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New methods for series-resistor calibrations on substrates with losses up to 110 GHz

dc.contributor.authorLiu, Song
dc.contributor.authorOrloff, Nathan
dc.contributor.authorLittle, Cully
dc.contributor.authorLu, Xifeng
dc.contributor.authorBooth, James
dc.contributor.authorOcket, Ilja
dc.contributor.authorSchreurs, Dominique
dc.contributor.authorNauwelaers, Bart
dc.date.accessioned2021-10-23T12:17:16Z
dc.date.available2021-10-23T12:17:16Z
dc.date.issued2016
dc.identifier.issn0018-9480
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26920
dc.sourceIIOimport
dc.titleNew methods for series-resistor calibrations on substrates with losses up to 110 GHz
dc.typeJournal article
dc.contributor.imecauthorOcket, Ilja
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorNauwelaers, Bart
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage4287
dc.source.endpage8297
dc.source.journalIEEE Transactions on Microwave Theory and Techniques
dc.source.issue12
dc.source.volume64
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7587379/
imec.availabilityPublished - open access


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