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Performance of TFET and FinFET devices applied to current mirrors for different dimensions and temperatures

dc.contributor.authorMartino, Marcio. D. V.
dc.contributor.authorMartino, Joan A.
dc.contributor.authorAgopian, Paula. G. D.
dc.contributor.authorRooyackers, Rita
dc.contributor.authorVandooren, Anne
dc.contributor.authorSimoen, Eddy
dc.contributor.authorThean, Aaron
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-23T12:37:00Z
dc.date.available2021-10-23T12:37:00Z
dc.date.issued2016
dc.identifier.issn0268-1242
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26975
dc.sourceIIOimport
dc.titlePerformance of TFET and FinFET devices applied to current mirrors for different dimensions and temperatures
dc.typeJournal article
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage55001
dc.source.journalSemiconductor Science and Technology
dc.source.issue5
dc.source.volume31
dc.identifier.urlhttp://iopscience.iop.org/article/10.1088/0268-1242/31/5/055001/meta
imec.availabilityPublished - imec


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