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Impact of the NW-TFET diameter on the efficiency and the intrinsic voltage gain from a conduction regime perspective

dc.contributor.authorMendes Bordallo, Ciao Cesar
dc.contributor.authorSivieri, V.B.
dc.contributor.authorMartino, Joao A.
dc.contributor.authorAgopian, Paula G. A.
dc.contributor.authorRooyackers, Rita
dc.contributor.authorVandooren, Anne
dc.contributor.authorSimoen, Eddy
dc.contributor.authorThean, Aaron
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-23T12:45:08Z
dc.date.available2021-10-23T12:45:08Z
dc.date.issued2016
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26997
dc.sourceIIOimport
dc.titleImpact of the NW-TFET diameter on the efficiency and the intrinsic voltage gain from a conduction regime perspective
dc.typeJournal article
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage2930
dc.source.endpage2935
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue7
dc.source.volume63
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7467453
imec.availabilityPublished - open access


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