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Low frequency noise analysis and modeling in vertical tunnel FETs with Ge Source

dc.contributor.authorNeves, Felipe
dc.contributor.authorAgopian, Paula G. D.
dc.contributor.authorMartino, Joao A.
dc.contributor.authorCretu, Bogdan
dc.contributor.authorRooyackers, Rita
dc.contributor.authorVandooren, Anne
dc.contributor.authorSimoen, Eddy
dc.contributor.authorThean, Aaron
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-23T13:14:39Z
dc.date.available2021-10-23T13:14:39Z
dc.date.issued2016
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27074
dc.sourceIIOimport
dc.titleLow frequency noise analysis and modeling in vertical tunnel FETs with Ge Source
dc.typeJournal article
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage1658
dc.source.endpage1665
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue4
dc.source.volume63
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7428915
imec.availabilityPublished - imec


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