Show simple item record

Analysis of point defect distributions in AlGaN/GaN heterostructures via spectroscopic photo current-voltage measurements

dc.contributor.authorOzden, Burcu
dc.contributor.authorKhanal, Min P
dc.contributor.authorYoun, Suhyeon
dc.contributor.authorMirkhani, Vahid
dc.contributor.authorYapabandara, Kosala
dc.contributor.authorPark, Minseo
dc.contributor.authorZhao, Ming
dc.contributor.authorLiang, Hu
dc.contributor.authorKandaswamy, Prem Kumar
dc.contributor.authorSaripalli, Yoga
dc.date.accessioned2021-10-23T13:26:35Z
dc.date.available2021-10-23T13:26:35Z
dc.date.issued2016
dc.identifier.issn2162-8769
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27104
dc.sourceIIOimport
dc.titleAnalysis of point defect distributions in AlGaN/GaN heterostructures via spectroscopic photo current-voltage measurements
dc.typeJournal article
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorLiang, Hu
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.source.peerreviewyes
dc.source.beginpage3206
dc.source.endpage3210
dc.source.journalECS Journal of Solid State Science and Technology
dc.source.issue4
dc.source.volume5
dc.identifier.urlhttp://jss.ecsdl.org/content/5/4/P3206.full.pdf+html
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record