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Fast particle characterization using digital holography and neural networks

dc.contributor.authorSchneider, Bendix
dc.contributor.authorDambre, Joni
dc.contributor.authorBienstman, Peter
dc.date.accessioned2021-10-23T14:40:14Z
dc.date.available2021-10-23T14:40:14Z
dc.date.issued2016-01
dc.identifier.issn1559-128X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27277
dc.sourceIIOimport
dc.titleFast particle characterization using digital holography and neural networks
dc.typeJournal article
dc.contributor.imecauthorDambre, Joni
dc.contributor.imecauthorBienstman, Peter
dc.contributor.orcidimecBienstman, Peter::0000-0001-6259-464X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage133
dc.source.endpage139
dc.source.journalApplied Optics
dc.source.issue1
dc.source.volume55
dc.identifier.urlhttps://www.osapublishing.org/ao/abstract.cfm?uri=ao-55-1-133
imec.availabilityPublished - open access


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