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Random telegraph noise: the key to single defect studies in nano-devices

dc.contributor.authorSimoen, Eddy
dc.contributor.authorFang, Wen
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorLuo, Jun
dc.contributor.authorZhao, Chao
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-23T14:57:15Z
dc.date.available2021-10-23T14:57:15Z
dc.date.issued2016
dc.identifier.issn0040-6090
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27316
dc.sourceIIOimport
dc.titleRandom telegraph noise: the key to single defect studies in nano-devices
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage2
dc.source.endpage5
dc.source.journalThin Solid Films
dc.source.volume613
dc.identifier.urlhttps://doi.org/10.1016/j.tsf.2015.08.037
imec.availabilityPublished - imec
imec.internalnotesProceedings to be publ. in Thin Solid Films Paper from: E-MRS Symposium K: Transport and Photonics in group IV-based Nanodevices; Lille, May 2015


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