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Calibration of the effective tunneling bandgap in GaAsSb/InGaAs for improved TFET performance prediction

dc.contributor.authorSmets, Quentin
dc.contributor.authorVerhulst, Anne
dc.contributor.authorEl Kazzi, Salim
dc.contributor.authorGundlach, David
dc.contributor.authorRichter, Curt
dc.contributor.authorMocuta, Anda
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-23T15:03:49Z
dc.date.available2021-10-23T15:03:49Z
dc.date.issued2016
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27330
dc.sourceIIOimport
dc.titleCalibration of the effective tunneling bandgap in GaAsSb/InGaAs for improved TFET performance prediction
dc.typeJournal article
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage4248
dc.source.endpage4254
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue11
dc.source.volume63
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7572927/
imec.availabilityPublished - open access


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