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Experimental benchmarking of electrical methods and $l-Raman spectroscopy for channel temperature detection in AlGaN/GaN HEMTs

dc.contributor.authorSodan, Vice
dc.contributor.authorKosemura, Daisuke
dc.contributor.authorStoffels, Steve
dc.contributor.authorOprins, Herman
dc.contributor.authorBaelmans, Martine
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorDe Wolf, Ingrid
dc.date.accessioned2021-10-23T15:04:17Z
dc.date.available2021-10-23T15:04:17Z
dc.date.issued2016
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27331
dc.sourceIIOimport
dc.titleExperimental benchmarking of electrical methods and $l-Raman spectroscopy for channel temperature detection in AlGaN/GaN HEMTs
dc.typeJournal article
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorOprins, Herman
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecOprins, Herman::0000-0003-0680-4969
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage2321
dc.source.endpage2327
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue6
dc.source.volume63
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7456263
imec.availabilityPublished - open access


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