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Understanding physico-chemical aspects in the depth profiling of polymer:fullerene layers

dc.contributor.authorSurana, Supriya
dc.contributor.authorConard, Thierry
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorTait, Jeffrey
dc.contributor.authorBastos, Joao
dc.contributor.authorVoroshazi, Eszter
dc.contributor.authorHavelund, Rasmus
dc.contributor.authorTurbiez, Mathieu
dc.contributor.authorLouette, Pierre
dc.contributor.authorFelten, Alexandre
dc.contributor.authorPoleunis, Claude
dc.contributor.authorDelcorte, Arnaud
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-23T15:22:31Z
dc.date.available2021-10-23T15:22:31Z
dc.date.issued2016
dc.identifier.issn1932-7447
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27369
dc.sourceIIOimport
dc.titleUnderstanding physico-chemical aspects in the depth profiling of polymer:fullerene layers
dc.typeJournal article
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorBastos, Joao
dc.contributor.imecauthorVoroshazi, Eszter
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecBastos, Joao::0000-0002-8877-9850
dc.source.peerreviewyes
dc.source.beginpage28074
dc.source.endpage28082
dc.source.journalJournal of Physical Chemistry C
dc.source.issue49
dc.source.volume120
dc.identifier.urlhttp://pubs.acs.org/doi/abs/10.1021/acs.jpcc.6b09911
imec.availabilityPublished - imec


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