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Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress

dc.contributor.authorTallarico, Andrea N.
dc.contributor.authorStoffels, Steve
dc.contributor.authorMagnone, P.
dc.contributor.authorHu, Jie
dc.contributor.authorLenci, Silvia
dc.contributor.authorMarcon, Denis
dc.contributor.authorSangiorgi, E.
dc.contributor.authorFiegna, C.
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-23T15:25:45Z
dc.date.available2021-10-23T15:25:45Z
dc.date.issued2016
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27376
dc.sourceIIOimport
dc.titleReliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress
dc.typeJournal article
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorLenci, Silvia
dc.contributor.imecauthorMarcon, Denis
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewyes
dc.source.beginpage723
dc.source.endpage730
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue2
dc.source.volume63
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7373626
imec.availabilityPublished - imec


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