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Thin Co/Ni-based bottom pinned spin-transfer torque magnetic random access memory stacks with high annealing tolerance

dc.contributor.authorTomczak, Yoann
dc.contributor.authorSwerts, Johan
dc.contributor.authorMertens, Sofie
dc.contributor.authorLin, Tsann
dc.contributor.authorCouet, Sebastien
dc.contributor.authorLiu, Enlong
dc.contributor.authorSankaran, Kiroubanand
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorKim, Woojin
dc.contributor.authorSouriau, Laurent
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorFurnemont, Arnaud
dc.date.accessioned2021-10-23T15:37:16Z
dc.date.available2021-10-23T15:37:16Z
dc.date.issued2016
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27400
dc.sourceIIOimport
dc.titleThin Co/Ni-based bottom pinned spin-transfer torque magnetic random access memory stacks with high annealing tolerance
dc.typeJournal article
dc.contributor.imecauthorTomczak, Yoann
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorMertens, Sofie
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorSankaran, Kiroubanand
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorKim, Woojin
dc.contributor.imecauthorSouriau, Laurent
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.orcidimecMertens, Sofie::0000-0002-1482-6730
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecSankaran, Kiroubanand::0000-0001-6988-7269
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecSouriau, Laurent::0000-0002-5138-5938
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage42402
dc.source.journalApplied Physics Letters
dc.source.issue4
dc.source.volume108
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/apl/108/4/10.1063/1.4940772
imec.availabilityPublished - open access


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