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RTS noise due to lateral isolation related defects in submicron

dc.contributor.authorLukyanchikova, N.
dc.contributor.authorPetrichuk, M.
dc.contributor.authorGarbar, N.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, C.
dc.date.accessioned2021-10-01T08:29:19Z
dc.date.available2021-10-01T08:29:19Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2743
dc.sourceIIOimport
dc.titleRTS noise due to lateral isolation related defects in submicron
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage1561
dc.source.endpage1568
dc.source.journalMicroelectronics Reliability
dc.source.volume38
imec.availabilityPublished - imec


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