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Stochastic collocation for device-level variability analysis in integrated photonics

dc.contributor.authorXing, Yufei
dc.contributor.authorSpina, Domenico
dc.contributor.authorLi, Ang
dc.contributor.authorDhaene, Tom
dc.contributor.authorBogaerts, Wim
dc.date.accessioned2021-10-23T17:24:48Z
dc.date.available2021-10-23T17:24:48Z
dc.date.issued2016-03
dc.identifier.issn2327-9125
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27615
dc.sourceIIOimport
dc.titleStochastic collocation for device-level variability analysis in integrated photonics
dc.typeJournal article
dc.contributor.imecauthorSpina, Domenico
dc.contributor.imecauthorDhaene, Tom
dc.contributor.imecauthorBogaerts, Wim
dc.contributor.orcidimecSpina, Domenico::0000-0003-2379-5259
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.contributor.orcidimecBogaerts, Wim::0000-0003-1112-8950
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage93
dc.source.endpage100
dc.source.journalPhotonics Research
dc.source.issue4
dc.source.volume4
dc.identifier.urlhttps://www.osapublishing.org/prj/abstract.cfm?uri=prj-4-2-93
imec.availabilityPublished - open access


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