dc.contributor.author | Yu, Hao | |
dc.contributor.author | Schaekers, Marc | |
dc.contributor.author | Barla, Kathy | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Thean, Aaron | |
dc.contributor.author | De Meyer, Kristin | |
dc.date.accessioned | 2021-10-23T17:36:17Z | |
dc.date.available | 2021-10-23T17:36:17Z | |
dc.date.issued | 2016 | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/27637 | |
dc.source | IIOimport | |
dc.title | Contact resistivities of metal-insulator-semiconductor contacts and metal-semiconductor contacts | |
dc.type | Journal article | |
dc.contributor.imecauthor | Yu, Hao | |
dc.contributor.imecauthor | Schaekers, Marc | |
dc.contributor.imecauthor | Barla, Kathy | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.orcidimec | Yu, Hao::0000-0002-1976-0259 | |
dc.contributor.orcidimec | Schaekers, Marc::0000-0002-1496-7816 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 171602 | |
dc.source.journal | Applied Physics Letters | |
dc.source.issue | 17 | |
dc.source.volume | 108 | |
dc.identifier.url | http://scitation.aip.org/content/aip/journal/apl/108/17/10.1063/1.4947580 | |
imec.availability | Published - open access | |