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Simulation and measurement of multiplication in thin film electroluminescent devices with doped probe layers

dc.contributor.authorNeyts, K.
dc.contributor.authorCorlatan, D.
dc.date.accessioned2021-10-01T08:33:13Z
dc.date.available2021-10-01T08:33:13Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2801
dc.sourceIIOimport
dc.titleSimulation and measurement of multiplication in thin film electroluminescent devices with doped probe layers
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage768
dc.source.endpage777
dc.source.journalIEEE Trans. Electron Devices
dc.source.volume45
imec.availabilityPublished - imec


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