Nature of electron trap states under inversion at In0. 53Ga0. 47As/Al2O3 interfaces
dc.contributor.author | Colleoni, Davide | |
dc.contributor.author | Pourtois, Geoffrey | |
dc.contributor.author | Pasquarello, Alfredo | |
dc.date.accessioned | 2021-10-24T03:32:52Z | |
dc.date.available | 2021-10-24T03:32:52Z | |
dc.date.issued | 2017 | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/28051 | |
dc.source | IIOimport | |
dc.title | Nature of electron trap states under inversion at In0. 53Ga0. 47As/Al2O3 interfaces | |
dc.type | Journal article | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 111602 | |
dc.source.journal | Applied Physics Letters | |
dc.source.issue | 11 | |
dc.source.volume | 110 | |
dc.identifier.url | http://aip.scitation.org/doi/10.1063/1.4977980 | |
imec.availability | Published - open access |