Show simple item record

Effects of hole self-trapping by polarons on transport and negative bias illumination stress in amorphous-IGZO

dc.contributor.authorde Jamblinne de Meux, Albert
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorGenoe, Jan
dc.contributor.authorHeremans, Paul
dc.date.accessioned2021-10-24T03:49:10Z
dc.date.available2021-10-24T03:49:10Z
dc.date.issued2017
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28128
dc.sourceIIOimport
dc.titleEffects of hole self-trapping by polarons on transport and negative bias illumination stress in amorphous-IGZO
dc.typeJournal article
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.source.peerreviewyes
dc.source.beginpage161513
dc.source.journalJournal of Applied Physics
dc.source.issue16
dc.source.volume123
dc.identifier.urlhttp://aip.scitation.org/doi/10.1063/1.4986180
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record