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Effect of crystallisation on fatigue in sol-gel PZT ferroelectric capacitors with reactively sputtered RuO2 layers

dc.contributor.authorNorga, Gerd
dc.contributor.authorWouters, Dirk
dc.contributor.authorBartic, Andrei
dc.contributor.authorFè, Laura
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-01T08:34:21Z
dc.date.available2021-10-01T08:34:21Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2812
dc.sourceIIOimport
dc.titleEffect of crystallisation on fatigue in sol-gel PZT ferroelectric capacitors with reactively sputtered RuO2 layers
dc.typeProceedings paper
dc.source.peerreviewno
dc.source.beginpage3
dc.source.endpage6
dc.source.conferenceApplications of Ferroelectrics, 1998. ISAF 98. Proceedings of the 11th IEEE International Symposium
dc.source.conferencedate24/08/1998
dc.source.conferencelocationMontreux Switzerland
imec.availabilityPublished - imec


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