Show simple item record

Advances in failure analysis techniques for 3D-technology

dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorJacobs, Kristof J.P.
dc.date.accessioned2021-10-24T04:01:55Z
dc.date.available2021-10-24T04:01:55Z
dc.date.issued2017
dc.identifier.issn1526-1344
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28182
dc.sourceIIOimport
dc.titleAdvances in failure analysis techniques for 3D-technology
dc.typeJournal article
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorJacobs, Kristof J.P.
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.contributor.orcidimecJacobs, Kristof J.P.::0000-0002-1081-3633
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage21
dc.source.endpage25
dc.source.journalChip Scale Review
dc.source.issue3
dc.source.volume21
dc.identifier.urlhttp://www.chipscalereview.com/issue/1706/ChipScale_May_Jun_2017.pdf
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
35828.pdf
Size:
1012.Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record