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Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation

dc.contributor.authorGao, Rui
dc.contributor.authorManut, Azrif B.
dc.contributor.authorJi, Zhigang
dc.contributor.authorMa, Jigang
dc.contributor.authorDuan, Meng
dc.contributor.authorZhang, Jian Fu
dc.contributor.authorFranco, Jacopo
dc.contributor.authorHatta, Sharifah Wan Muhamad
dc.contributor.authorZhang, Wei Dong
dc.contributor.authorKaczer, Ben
dc.contributor.authorVigar, David
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-24T04:54:46Z
dc.date.available2021-10-24T04:54:46Z
dc.date.issued2017
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28368
dc.sourceIIOimport
dc.titleReliable time exponents for long term prediction of negative bias temperature instability by extrapolation
dc.typeJournal article
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1467
dc.source.endpage1473
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue4
dc.source.volume64
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7870682/
imec.availabilityPublished - open access


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