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Critical thickness and strain relaxation in lattice mismatched II-VI semiconductor layers

dc.contributor.authorPinardi, Kuntjoro
dc.contributor.authorJain, Uma
dc.contributor.authorJain, Suresh
dc.contributor.authorMaes, Herman
dc.contributor.authorVan Overstraeten, Roger
dc.contributor.authorWillander, M.
dc.date.accessioned2021-10-01T08:41:13Z
dc.date.available2021-10-01T08:41:13Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2865
dc.sourceIIOimport
dc.titleCritical thickness and strain relaxation in lattice mismatched II-VI semiconductor layers
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage4724
dc.source.endpage4733
dc.source.journalJournal of Applied Physics
dc.source.issue9
dc.source.volume83
imec.availabilityPublished - imec


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