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Impact and mitigation of sense amplifier aging degradation using realistic workloads

dc.contributor.authorKraak, Daniel
dc.contributor.authorAgbo, Innocent
dc.contributor.authorTaouil, Motta
dc.contributor.authorHamdioui, Said
dc.contributor.authorWeckx, Pieter
dc.contributor.authorCosemans, Stefan
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-24T07:08:02Z
dc.date.available2021-10-24T07:08:02Z
dc.date.issued2017
dc.identifier.issn1063-8210
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28709
dc.sourceIIOimport
dc.titleImpact and mitigation of sense amplifier aging degradation using realistic workloads
dc.typeJournal article
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage319
dc.source.endpage327
dc.source.journalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
dc.source.issue12
dc.source.volume25
dc.identifier.urlhttp://ieeexplore.ieee.org/document/8052501/
imec.availabilityPublished - open access


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