Show simple item record

Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups

dc.contributor.authorLanza, Mario
dc.contributor.authorCelano, Umberto
dc.contributor.authorFeng, Miao.Innovation Center of Adva
dc.date.accessioned2021-10-24T07:26:45Z
dc.date.available2021-10-24T07:26:45Z
dc.date.issued2017
dc.identifier.issn1385-3449
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28752
dc.sourceIIOimport
dc.titleNanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups
dc.typeJournal article
dc.contributor.imecauthorCelano, Umberto
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage94
dc.source.endpage108
dc.source.journalJournal of Electroceramics
dc.source.issue1_4
dc.source.volume39
dc.identifier.urlhttps://link.springer.com/article/10.1007/s10832-017-0082-1
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
35416.pdf
Size:
3.815Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record