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Wireless technology recognition based on RSSI distribution at sub-nyquist sampling rate for constrained devices

dc.contributor.authorLiu, Wei
dc.contributor.authorKulin, Merima
dc.contributor.authorKazaz, Tarik
dc.contributor.authorShahid, Adnan
dc.contributor.authorMoerman, Ingrid
dc.contributor.authorDe Poorter, Eli
dc.date.accessioned2021-10-24T08:05:22Z
dc.date.available2021-10-24T08:05:22Z
dc.date.issued2017-09
dc.identifier.issn1424-8220
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28836
dc.sourceIIOimport
dc.titleWireless technology recognition based on RSSI distribution at sub-nyquist sampling rate for constrained devices
dc.typeJournal article
dc.contributor.imecauthorLiu, Wei
dc.contributor.imecauthorShahid, Adnan
dc.contributor.imecauthorMoerman, Ingrid
dc.contributor.imecauthorDe Poorter, Eli
dc.contributor.orcidimecLiu, Wei::0000-0002-6573-2881
dc.contributor.orcidimecShahid, Adnan::0000-0003-1943-6261
dc.contributor.orcidimecMoerman, Ingrid::0000-0003-2377-3674
dc.contributor.orcidimecDe Poorter, Eli::0000-0002-0214-5751
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage23
dc.source.journalSensors
dc.source.issue9
dc.source.volume17
dc.identifier.urlhttp://www.mdpi.com/1424-8220/17/9/2081
imec.availabilityPublished - open access


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