dc.contributor.author | Marchal, Wouter | |
dc.contributor.author | Verboven, Inge | |
dc.contributor.author | Kesters, Jurgen | |
dc.contributor.author | Moeremans, Boaz | |
dc.contributor.author | De Dobbelaere, Christopher | |
dc.contributor.author | Bonneux, Gilles | |
dc.contributor.author | Elen, Ken | |
dc.contributor.author | Conings, Bert | |
dc.contributor.author | Maes, Wouter | |
dc.contributor.author | Boyen, Hans-Gerd | |
dc.contributor.author | Deferme, Wim | |
dc.contributor.author | Van Bael, Marlies | |
dc.contributor.author | Hardy, An | |
dc.date.accessioned | 2021-10-24T08:44:38Z | |
dc.date.available | 2021-10-24T08:44:38Z | |
dc.date.issued | 2017 | |
dc.identifier.issn | 1996-1944 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/28915 | |
dc.source | IIOimport | |
dc.title | Steering the properties of MoOX hole transporting layers in OPV's and OLED's: Interface morphology vs. electronic structure | |
dc.type | Journal article | |
dc.contributor.imecauthor | Verboven, Inge | |
dc.contributor.imecauthor | Bonneux, Gilles | |
dc.contributor.imecauthor | Elen, Ken | |
dc.contributor.imecauthor | Conings, Bert | |
dc.contributor.imecauthor | Maes, Wouter | |
dc.contributor.imecauthor | Boyen, Hans-Gerd | |
dc.contributor.imecauthor | Deferme, Wim | |
dc.contributor.imecauthor | Van Bael, Marlies | |
dc.contributor.imecauthor | Hardy, An | |
dc.contributor.orcidimec | Elen, Ken::0000-0001-6907-0355 | |
dc.contributor.orcidimec | Van Bael, Marlies::0000-0002-5516-7962 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.3390/ma10020123 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 123 | |
dc.source.journal | Materials | |
dc.source.volume | 10 | |
dc.identifier.url | http://www.mdpi.com/1996-1944/10/2/123 | |
imec.availability | Published - open access | |