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Evaluation of advanced probe cards for large-array fine-pitch micro-bumps

dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorFodor, Ferenc
dc.contributor.authorDe Wachter, Bart
dc.contributor.authorKiesewetter, Joerg
dc.contributor.authorSmith, Ken
dc.contributor.authorHill, Eric
dc.date.accessioned2021-10-24T08:47:58Z
dc.date.available2021-10-24T08:47:58Z
dc.date.issued2017-11
dc.identifier.issn1526-1344
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28922
dc.sourceIIOimport
dc.titleEvaluation of advanced probe cards for large-array fine-pitch micro-bumps
dc.typeJournal article
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorFodor, Ferenc
dc.contributor.imecauthorDe Wachter, Bart
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewno
dc.source.beginpage16
dc.source.endpage20
dc.source.journalChip Scale Review
dc.source.issue6
dc.source.volume21
dc.identifier.urlhttp://www.chipscalereview.com/issue/1712/ChipScale_Nov_Dec_2017.pdf
imec.availabilityPublished - imec


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