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Surface potential investigation on interdigitated back contact solar cells by scanning electron microscopy and Kelvin probe force microscopy: effect of electrical bias

dc.contributor.authorNarchi, Paul
dc.contributor.authorNeplokh, Vladimir
dc.contributor.authorPiazza, Valerio
dc.contributor.authorBearda, Twan
dc.contributor.authorBayle, Fabien
dc.contributor.authorFoldyna, Martin
dc.contributor.authorToccafondi, Chiara
dc.contributor.authorProd'Homme, Patricia
dc.contributor.authorTchernycheva, Maria
dc.contributor.authorRoca i Cabarrocas, Pere
dc.date.accessioned2021-10-24T10:03:07Z
dc.date.available2021-10-24T10:03:07Z
dc.date.issued2017
dc.identifier.issn0927-0248
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29068
dc.sourceIIOimport
dc.titleSurface potential investigation on interdigitated back contact solar cells by scanning electron microscopy and Kelvin probe force microscopy: effect of electrical bias
dc.typeJournal article
dc.source.peerreviewyes
dc.source.beginpage263
dc.source.endpage269
dc.source.journalSolar Energy Materials and Solar Cells
dc.source.volume161
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S092702481630530X
imec.availabilityPublished - imec


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