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Techniques for reducing the number of decisions and backtracks in combinational test generation

dc.contributor.authorSahraoui, Z.
dc.contributor.authorCatthoor, Francky
dc.contributor.authorSix, Paul
dc.contributor.authorDe Man, Hugo
dc.date.accessioned2021-10-01T08:50:54Z
dc.date.available2021-10-01T08:50:54Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2922
dc.sourceIIOimport
dc.titleTechniques for reducing the number of decisions and backtracks in combinational test generation
dc.typeJournal article
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorDe Man, Hugo
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage217
dc.source.endpage238
dc.source.journalJournal of Electronic Testing: Theory and Applications
dc.source.issue3
dc.source.volume12
imec.availabilityPublished - open access


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