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Characterization of bolometers based on polycrystalline silicon germanium alloys

dc.contributor.authorSedky, Sherif
dc.contributor.authorFiorini, Paolo
dc.contributor.authorCaymax, Matty
dc.contributor.authorBaert, Kris
dc.contributor.authorHermans, Lou
dc.contributor.authorMertens, Robert
dc.date.accessioned2021-10-01T08:54:21Z
dc.date.available2021-10-01T08:54:21Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2940
dc.sourceIIOimport
dc.titleCharacterization of bolometers based on polycrystalline silicon germanium alloys
dc.typeJournal article
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorMertens, Robert
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage376
dc.source.endpage379
dc.source.journalIEEE Electron Device Letters
dc.source.issue10
dc.source.volume19
imec.availabilityPublished - open access


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