Show simple item record

Carbon-related defects in Si:C/silicon heterostructures assessed by deep-level transient spectroscopy

dc.contributor.authorSimoen, Eddy
dc.contributor.authorDhayalan, Sathish Kumar
dc.contributor.authorHikavyy, Andriy
dc.contributor.authorLoo, Roger
dc.contributor.authorRosseel, Erik
dc.contributor.authorVrielinck, Henk
dc.contributor.authorLauwaert, Johan
dc.date.accessioned2021-10-24T13:33:46Z
dc.date.available2021-10-24T13:33:46Z
dc.date.issued2017
dc.identifier.issn2162-8769
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29438
dc.sourceIIOimport
dc.titleCarbon-related defects in Si:C/silicon heterostructures assessed by deep-level transient spectroscopy
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHikavyy, Andriy
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorRosseel, Erik
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHikavyy, Andriy::0000-0002-8201-075X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewyes
dc.source.beginpageP284
dc.source.endpageP289
dc.source.journalECS Journal of Solid State Science and Technology
dc.source.issue5
dc.source.volume6
dc.identifier.urlhttp://jss.ecsdl.org/content/6/5/P284.abstract
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record