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A deep-level transient spectroscopy study of silicon Schottky barriers containing a Si-O superlattice

dc.contributor.authorSimoen, Eddy
dc.contributor.authorJayachandran, Suseendran
dc.contributor.authorDelabie, Annelies
dc.contributor.authorCaymax, Matty
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-24T13:35:01Z
dc.date.available2021-10-24T13:35:01Z
dc.date.issued2017
dc.identifier.issn0370-1972
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29440
dc.sourceIIOimport
dc.titleA deep-level transient spectroscopy study of silicon Schottky barriers containing a Si-O superlattice
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorJayachandran, Suseendran
dc.contributor.imecauthorDelabie, Annelies
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage1600593
dc.source.journalPhysica Status Solidi B
dc.source.issue4
dc.source.volume254
dc.identifier.urlhttp://onlinelibrary.wiley.com/doi/10.1002/pssb.201600593/full
imec.availabilityPublished - imec


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