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Study of electron traps associated with oxygen superlattices in n-type silicon

dc.contributor.authorSimoen, Eddy
dc.contributor.authorJayachandran, Suseendran
dc.contributor.authorDelabie, Annelies
dc.contributor.authorCaymax, Matty
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-24T13:35:38Z
dc.date.available2021-10-24T13:35:38Z
dc.date.issued2017
dc.identifier.issn1610-1634
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29441
dc.sourceIIOimport
dc.titleStudy of electron traps associated with oxygen superlattices in n-type silicon
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorJayachandran, Suseendran
dc.contributor.imecauthorDelabie, Annelies
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage1700136
dc.source.journalPhysica Status Solidi C
dc.source.issue12
dc.source.volume14
dc.identifier.urlhttp://onlinelibrary.wiley.com/doi/10.1002/pssc.201700136/abstract
imec.availabilityPublished - imec
imec.internalnotespaper e-mrs spring 2017 Strasbourg


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