Factors determining the damage coefficient and the low-frequency noise in MeV proton-irradiated silicon diodes
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Ohyama, Hidenori | |
dc.date.accessioned | 2021-10-01T08:56:06Z | |
dc.date.available | 2021-10-01T08:56:06Z | |
dc.date.issued | 1998 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2949 | |
dc.source | IIOimport | |
dc.title | Factors determining the damage coefficient and the low-frequency noise in MeV proton-irradiated silicon diodes | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 89 | |
dc.source.endpage | 97 | |
dc.source.journal | IEEE Trans. Nuclear Science | |
dc.source.issue | 1 | |
dc.source.volume | 45 | |
imec.availability | Published - open access |