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Improved and accurate physics-of-failure (PoF) nethodology for qualification and lifetime assessment of electronic systems

dc.contributor.authorTemsamani, A.B.
dc.contributor.authorKauffmann, S.
dc.contributor.authorDescas, Y.
dc.contributor.authorVandevelde, Bart
dc.contributor.authorZanon, Franco
dc.contributor.authorWillems, Geert
dc.date.accessioned2021-10-24T14:50:30Z
dc.date.available2021-10-24T14:50:30Z
dc.date.issued2017
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29560
dc.sourceIIOimport
dc.titleImproved and accurate physics-of-failure (PoF) nethodology for qualification and lifetime assessment of electronic systems
dc.typeJournal article
dc.contributor.imecauthorVandevelde, Bart
dc.contributor.imecauthorWillems, Geert
dc.contributor.orcidimecVandevelde, Bart::0000-0002-6753-6438
dc.contributor.orcidimecWillems, Geert::0000-0002-9137-618X
dc.source.peerreviewyes
dc.source.beginpage42
dc.source.endpage46
dc.source.journalMicroelectronics Reliability
dc.source.volume76-77
dc.identifier.urlhttps://www.sciencedirect.com/science/article/pii/S0026271417302354
imec.availabilityPublished - imec


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