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Multisensor X-ray inspection of internal defects in horticultural products

dc.contributor.authorvan Dael, M.
dc.contributor.authorVerboven, P.
dc.contributor.authorDhaene, J.
dc.contributor.authorVan Hoorebeke, L.
dc.contributor.authorSijbers, Jan
dc.contributor.authorNicolai, B.
dc.date.accessioned2021-10-24T15:36:01Z
dc.date.available2021-10-24T15:36:01Z
dc.date.issued2017-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29631
dc.sourceIIOimport
dc.titleMultisensor X-ray inspection of internal defects in horticultural products
dc.typeJournal article
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.source.peerreviewyes
dc.source.beginpage33
dc.source.endpage43
dc.source.journalPostharvest Biology and Technology
dc.source.volume128
dc.identifier.urlhttps://www.sciencedirect.com/science/article/pii/S0925521416304690?via%3Dihub
imec.availabilityPublished - imec


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