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dc.contributor.authorVan Nieuwenhove, Vincent
dc.contributor.authorDe Beenhouwer, Jan
dc.contributor.authorDe Schryver, Thomas
dc.contributor.authorVan Hoorebeke, Luc
dc.contributor.authorSijbers, Jan
dc.date.accessioned2021-10-24T16:32:33Z
dc.date.available2021-10-24T16:32:33Z
dc.date.issued2017-01
dc.identifier.issn1057-7149
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29722
dc.sourceIIOimport
dc.titleData-driven affine deformation estimation and correction in cone beam computed tomography
dc.typeJournal article
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1441
dc.source.endpage1451
dc.source.journalIEEE Transactions on Image Processing
dc.source.issue26
dc.source.volume2017
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7819548/?reload=true
imec.availabilityPublished - open access


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