dc.contributor.author | Van Nieuwenhove, Vincent | |
dc.contributor.author | De Beenhouwer, Jan | |
dc.contributor.author | De Schryver, Thomas | |
dc.contributor.author | Van Hoorebeke, Luc | |
dc.contributor.author | Sijbers, Jan | |
dc.date.accessioned | 2021-10-24T16:32:33Z | |
dc.date.available | 2021-10-24T16:32:33Z | |
dc.date.issued | 2017-01 | |
dc.identifier.issn | 1057-7149 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/29722 | |
dc.source | IIOimport | |
dc.title | Data-driven affine deformation estimation and correction in cone beam computed tomography | |
dc.type | Journal article | |
dc.contributor.imecauthor | De Beenhouwer, Jan | |
dc.contributor.imecauthor | Sijbers, Jan | |
dc.contributor.orcidimec | De Beenhouwer, Jan::0000-0001-5253-1274 | |
dc.contributor.orcidimec | Sijbers, Jan::0000-0003-4225-2487 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1441 | |
dc.source.endpage | 1451 | |
dc.source.journal | IEEE Transactions on Image Processing | |
dc.source.issue | 26 | |
dc.source.volume | 2017 | |
dc.identifier.url | http://ieeexplore.ieee.org/document/7819548/?reload=true | |
imec.availability | Published - open access | |