dc.contributor.author | Waltl, Michael | |
dc.contributor.author | Rzepa, Gerhard | |
dc.contributor.author | Grill, A. | |
dc.contributor.author | Goes, Wolfgang | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Witters, Liesbeth | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Grasser, Tibor | |
dc.date.accessioned | 2021-10-24T18:26:51Z | |
dc.date.available | 2021-10-24T18:26:51Z | |
dc.date.issued | 2017 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/29892 | |
dc.source | IIOimport | |
dc.title | Superior NBTI in high-k SiGe transistors - Part II: theory | |
dc.type | Journal article | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Witters, Liesbeth | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2099 | |
dc.source.endpage | 2105 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 5 | |
dc.source.volume | 64 | |
dc.identifier.url | http://ieeexplore.ieee.org/document/7891510/ | |
imec.availability | Published - open access | |