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dc.contributor.authorWinkler, Stefan
dc.contributor.authorWen Chen, Chang
dc.contributor.authorRaake, Alexander
dc.contributor.authorSchelkens, Peter
dc.contributor.authorSkorin-Kapov, Lea
dc.date.accessioned2021-10-24T19:02:41Z
dc.date.available2021-10-24T19:02:41Z
dc.date.issued2017-02
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29943
dc.sourceIIOimport
dc.titleIntroduction to the special issue on 'Measuring Quality of Experience for Advanced Media Technologies and Services'
dc.typeJournal article
dc.contributor.imecauthorSchelkens, Peter
dc.contributor.orcidimecSchelkens, Peter::0000-0003-0908-1655
dc.source.peerreviewno
dc.source.beginpage335
dc.source.endpage340
dc.source.journalIEEE Journal of Selected Topics in Signal Processing
dc.source.issue1
dc.source.volume11
dc.identifier.urlhttps://ieeexplore.ieee.org/document/7852547/
imec.availabilityPublished - imec


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