Materials properties of (strained) SiGe layers
dc.contributor.author | Poortmans, Jef | |
dc.contributor.author | Jain, Suresh | |
dc.contributor.author | Nijs, Johan | |
dc.contributor.author | Van Overstraeten, Roger | |
dc.date.accessioned | 2021-09-29T12:45:31Z | |
dc.date.available | 2021-09-29T12:45:31Z | |
dc.date.issued | 1994 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/299 | |
dc.source | IIOimport | |
dc.title | Materials properties of (strained) SiGe layers | |
dc.type | Book chapter | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 185 | |
dc.source.book | Advanced Silicon and Semiconducting Silicon-Alloy Based Materials and Devices | |
dc.source.endpage | 214 | |
imec.availability | Published - open access | |
imec.internalnotes | Chapter 5 |