Browsing Book chapters by author "Hantschel, Thomas"
Now showing items 1-3 of 3
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Diamond Probes Technology
Hantschel, Thomas; Conard, Thierry; Kilpatrick, Jason; Cross, Graham (2019) -
Scanning Spreading Resistance Microscopy (SSRM): High resolution 2D and 3D carrier mapping of semiconductor nanostructures
Schulze, Andreas; Eyben, Pierre; Hantschel, Thomas; Vandervorst, Wilfried (2017) -
Sub-nanometer characterization of nanoelectronic devices
Eyben, Pierre; Mody, Jay; Nazir, Aftab; Schulze, Andreas; Clarysse, Trudo; Hantschel, Thomas; Vandervorst, Wilfried (2013)