Browsing Book chapters by imec author "d4c522396826614665149dd5fc626e995d6812ef"
Now showing items 1-5 of 5
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Advanced material characterization by TOFSIMS in microelectronics
Conard, Thierry; Vandervorst, Wilfried (2005) -
Diamond Probes Technology
Hantschel, Thomas; Conard, Thierry; Kilpatrick, Jason; Cross, Graham (2019) -
Fabrication of MBE high-k MOSFETs in a standard CMOS flow
Pantisano, Luigi; Conard, Thierry; Schram, Tom; Deweerd, Wim; De Gendt, Stefan; Heyns, Marc; Rittersma, C.; Marchiori, C.; Sousa, M.; Fompeyrine, F.; Locquet, J.P. (2007) -
Germanium deep-submicron p-FET and n-FET devices, fabricated on germanium-on-insulator substrates
Meuris, Marc; De Jaeger, Brice; Van Steenbergen, Jan; Bonzom, Renaud; Caymax, Matty; Houssa, Michel; Kaczer, Ben; Leys, Frederik; Martens, Koen; Opsomer, Karl; Pourghaderi, Mohammad Ali; Satta, Alessandra; Simoen, Eddy; Terzieva, Valentina; Van Moorhem, Els; Winderickx, Gillis; Loo, Roger; Clarysse, Trudo; Conard, Thierry; Delabie, Annelies; Hellin, David; Janssens, Tom; Onsia, Bart; Sioncke, Sonja; Mertens, Paul; Snow, Jim; Van Elshocht, Sven; Vandervorst, Wilfried; Zimmerman, Paul; Brunco, David; Raskin, G.; Letertre, F.; Akatsu, T.; Billon, T.; Heyns, Marc (2007) -
Physical characterization of ultra-thin high k dielectrics
Conard, Thierry; Bender, Hugo; Vandervorst, Wilfried (2007-02)