Browsing Book chapters by author "Kaczer, Ben"
Now showing items 1-8 of 8
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Channel hot carrier degradation and self-heating effects in FinFETs
Cho, Moon Ju; Bury, Erik; Kaczer, Ben; Groeseneken, Guido (2014) -
Characterization of individual traps in high-k oxides
Toledano Luque, Maria; Kaczer, Ben (2014) -
Defect-Based Compact Modeling of Random Telegraph Noise
Weckx, Pieter; Kaczer, Ben; Simicic, Marko; Parvais, Bertrand; Linten, Dimitri (2020) -
Electrical characterization of advanced gate dielectrics
Degraeve, Robin; Schmitz, Jurrian; Pantisano, Luigi; Simoen, Eddy; Houssa, Michel; Kaczer, Ben; Groeseneken, Guido (2007) -
Germanium deep-submicron p-FET and n-FET devices, fabricated on germanium-on-insulator substrates
Meuris, Marc; De Jaeger, Brice; Van Steenbergen, Jan; Bonzom, Renaud; Caymax, Matty; Houssa, Michel; Kaczer, Ben; Leys, Frederik; Martens, Koen; Opsomer, Karl; Pourghaderi, Mohammad Ali; Satta, Alessandra; Simoen, Eddy; Terzieva, Valentina; Van Moorhem, Els; Winderickx, Gillis; Loo, Roger; Clarysse, Trudo; Conard, Thierry; Delabie, Annelies; Hellin, David; Janssens, Tom; Onsia, Bart; Sioncke, Sonja; Mertens, Paul; Snow, Jim; Van Elshocht, Sven; Vandervorst, Wilfried; Zimmerman, Paul; Brunco, David; Raskin, G.; Letertre, F.; Akatsu, T.; Billon, T.; Heyns, Marc (2007) -
Manufacturing solutions
Evans, Adrian; Hamdioui, Said; Kaczer, Ben (2018) -
Statistical distribution of defect parameters
Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Weckx, Pieter (2014) -
Toward engineering modeling of negative bias temperature instability
Grasser, Tibor; Goes, Wolfgang; Kaczer, Ben (2009)