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Book chapters
Channel hot carrier degradation and self-heating effects in FinFETs
Publication:
Channel hot carrier degradation and self-heating effects in FinFETs
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Date
2014
Book Chapter
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cho, Moon Ju
;
Bury, Erik
;
Kaczer, Ben
;
Groeseneken, Guido
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Abstract
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1952
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Acq. date: 2026-01-09
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Views
1952
since deposited on 2021-10-22
2
last month
2
last week
Acq. date: 2026-01-09
Citations