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Impact and mitigation of SRAM read path aging

dc.contributor.authorAgbo, Innocent
dc.contributor.authorTaouil, Motta
dc.contributor.authorKraak, Daniel
dc.contributor.authorHamdioui, Said
dc.contributor.authorWeckx, Pieter
dc.contributor.authorCosemans, Stefan
dc.contributor.authorCatthoor, Francky
dc.contributor.authorDehaene, Wim
dc.date.accessioned2021-10-25T16:31:08Z
dc.date.available2021-10-25T16:31:08Z
dc.date.issued2018
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30080
dc.sourceIIOimport
dc.titleImpact and mitigation of SRAM read path aging
dc.typeJournal article
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorDehaene, Wim
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.source.peerreviewyes
dc.source.beginpage158
dc.source.endpage167
dc.source.journalMicroelectronics Reliability
dc.source.volume87
dc.identifier.urlhttps://www.sciencedirect.com/science/article/pii/S0026271418302956
imec.availabilityPublished - imec


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