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Influence of the chalcogen element on the filament stability in CuIn(Te,Se,S)2/Al2O3 filamentary switching devices

dc.contributor.authorAhmad, Tareq
dc.contributor.authorDevulder, Wouter
dc.contributor.authorOpsomer, Karl
dc.contributor.authorMinjauw, Matthias
dc.contributor.authorCelano, Umberto
dc.contributor.authorHantschel, Thomas
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorGoux, Ludovic
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorDetavernier, Christophe
dc.date.accessioned2021-10-25T16:31:22Z
dc.date.available2021-10-25T16:31:22Z
dc.date.issued2018
dc.identifier.issn1944-8244
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30088
dc.sourceIIOimport
dc.titleInfluence of the chalcogen element on the filament stability in CuIn(Te,Se,S)2/Al2O3 filamentary switching devices
dc.typeJournal article
dc.contributor.imecauthorDevulder, Wouter
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecDevulder, Wouter::0000-0002-5156-0177
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.source.peerreviewyes
dc.source.beginpage14835
dc.source.endpage14842
dc.source.journalACS Applied Materials & Interfaces
dc.source.issue17
dc.source.volume10
dc.identifier.urlhttps://pubs.acs.org/doi/abs/10.1021/acsami.7b18228
imec.availabilityPublished - imec


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