dc.contributor.author | Aouassa, Mansour | |
dc.contributor.author | Vrielinck, Henk | |
dc.contributor.author | Simoen, Eddy | |
dc.date.accessioned | 2021-10-25T16:34:07Z | |
dc.date.available | 2021-10-25T16:34:07Z | |
dc.date.issued | 2018 | |
dc.identifier.issn | 2162-8769 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30140 | |
dc.source | IIOimport | |
dc.title | Deep level assessment of n-type Si/SiO2 metal-oxide-semiconductor capacitors with embedded Ge quantum dots | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | P24 | |
dc.source.endpage | P28 | |
dc.source.journal | ECS Journal of Solid State Science and Technology | |
dc.source.issue | 2 | |
dc.source.volume | 7 | |
dc.identifier.url | http://jss.ecsdl.org/content/7/2/P24.full | |
imec.availability | Published - open access | |