dc.contributor.author | Bao, Xiue | |
dc.contributor.author | Liu, Song | |
dc.contributor.author | Ocket, Ilja | |
dc.contributor.author | Bao, Juncheng | |
dc.contributor.author | Schreurs, Dominique | |
dc.contributor.author | Zhang, Shengkang | |
dc.contributor.author | Cheng, Chunyue | |
dc.contributor.author | Feng, Keming | |
dc.contributor.author | Nauwelaers, Bart | |
dc.date.accessioned | 2021-10-25T16:38:45Z | |
dc.date.available | 2021-10-25T16:38:45Z | |
dc.date.issued | 2018 | |
dc.identifier.issn | 1531-1309 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/30197 | |
dc.source | IIOimport | |
dc.title | A general line-line method for dielectric material characterization using conductors with the same cross-sectional geometry | |
dc.type | Journal article | |
dc.contributor.imecauthor | Ocket, Ilja | |
dc.contributor.imecauthor | Schreurs, Dominique | |
dc.contributor.imecauthor | Nauwelaers, Bart | |
dc.contributor.orcidimec | Ocket, Ilja::0000-0002-1503-7397 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 356 | |
dc.source.endpage | 358 | |
dc.source.journal | IEEE Microwave and Wireless Components Letters | |
dc.source.issue | 4 | |
dc.source.volume | 28 | |
dc.identifier.url | https://ieeexplore.ieee.org/document/8310028/ | |
imec.availability | Published - imec | |