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Advanced X/ray tomography: experiment, modeling, and algorithms

dc.contributor.authorBatenburg, K.J.
dc.contributor.authorDe Carlo, Francesco
dc.contributor.authorMancini, Lucia
dc.contributor.authorSijbers, Jan
dc.date.accessioned2021-10-25T16:40:37Z
dc.date.available2021-10-25T16:40:37Z
dc.date.issued2018-12
dc.identifier.issn0957-0233
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30215
dc.sourceIIOimport
dc.titleAdvanced X/ray tomography: experiment, modeling, and algorithms
dc.typeJournal article
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.source.peerreviewyes
dc.source.beginpage80101
dc.source.endpage80101
dc.source.journalMeasurement Science and Technology
dc.source.issue8
dc.source.volume29
dc.identifier.urlhttp://iopscience.iop.org/article/10.1088/1361-6501/aacd25/meta
imec.availabilityPublished - imec


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