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The impact of the temperature on In0.53Ga0.47As nTFETs

dc.contributor.authorBordallo, Caio
dc.contributor.authorMartino, J.A.
dc.contributor.authorAgopian, P.G.D.
dc.contributor.authorAlian, AliReza
dc.contributor.authorMols, Yves
dc.contributor.authorRooyackers, Rita
dc.contributor.authorVandooren, Anne
dc.contributor.authorVerhulst, Anne
dc.contributor.authorMocuta, Dan
dc.contributor.authorLin, Dennis
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorCollaert, Nadine
dc.date.accessioned2021-10-25T16:52:07Z
dc.date.available2021-10-25T16:52:07Z
dc.date.issued2018
dc.identifier.issn2516-3914
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30300
dc.sourceIIOimport
dc.titleThe impact of the temperature on In0.53Ga0.47As nTFETs
dc.typeJournal article
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorMols, Yves
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.journalNanoelectronic Devices
dc.source.issue1
dc.source.volume18
dc.identifier.urlhttps://www.openscience.fr/The-impact-of-the-temperature-on-In0-53Ga0-47As-nTFETs
imec.availabilityPublished - open access


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